Análise de single-event effects em arquiteturas de células de memória dice e norley

Abstract

The constant progress achieved by the manufacturing technologies of electronic devices has led to significant reductions in the transistors sizes, reaching nanometer sizes. Also, it is observed a decrease in the operating voltages and a increase in the clock frequencies. Given this scenario, and the increasing integration level of the integrated circuits, the sensitivity of these components to particles in the atmosphere has also increased, even for devices that operate at the sea level. Because of this, applications that require a high level of reliability and security have begun to consider the inclusion of fault tolerance mechanisms already in the design phase even in hardware as in software. This work aims to perform an analysis of Single-Event Effects in radiation tolerant architectures of memory cells Norley and DICE, beyond the traditional six transistors model, at schematic level by using the software SmartSpice of the company Silvaco Inc. The main objective is obtain data about the behavior of these structures in an environment similar to that found in the South Atlantic Magnetic Anomaly, which is situated on a large part of Brazil.