Implementação de células de memória e simulações de Single Event Effects

Abstract

This project consists of a Computer Science Graduation Work from Federal University of Santa Maria. In this project were studied techniques and tools for simulation of Single Event Effects (SEE) - radiation effects on integrated circuits - using the SmartSpice software, on different architectures of memory cells in schematic level. The disturbance’s simulation caused by radiation on eletronic devices become mandatory for applications that need high reliability and security, been performed since initial stages of the project. With that simulations, a survey was made about the charged particles impact trapped on the atmosphere and ground level on these circuits. The objective was to simulate Single Event Effects in the default 6 transistors memory cell, besides the Whitaker/Liu and the HIT cells, designed to be radiation tolerant. It will possibility its posterior use by Santa Maria Design House (SMDH), in cooperation with Southern Regional Space Research Center from National Institute for Space Research (CRS/INPE).